History and Milestones

Our industry and company milestones:

1984
  • Introduction of the industry’s first Computer Controlled Life Cycle Tester
1985
  • Introduction of the .050 inch centers, .160 inch stroke (050-16 series) test probes, sockets and wire plugs
1986
  • Open House at our new manufacturing facility at 4 Merrill Industrial Drive in Hampton, New Hampshire
  • U.S. patent #4,597,622 is granted for WP30 and WP28 wire plug and plug housing
  • Probe marking system is introduced for visual ­designation of spring force and tube ­materials/finishes
1987
  • U.S. Patent #4,659,987 is granted for 050-16 Series test probes and connectors
1988
  • Introduction of the more accurate double press ring socket design for the 050-16 Series
1989
  • The rolled tube design 100-25, 100-40 and 075-25 Series test probes are introduced
  • U.S. Patent #4,885,533 is granted for the rolled tube designs
1993
  • Building expanded an additional 20,000 square feet, bringing QA’s headquarters to a total of 35,000 square feet
  • Introduction of the industry’s first triple press ring socket for the 050-25 Series.
  • Introduction of an automatic socket assembly machine creating leaktight receptacles, ­hermetically soldering the wire wrap pin into the socket
1996
  • U.S. Patent #5,524,466 is granted for the triple press ring socket
1998
  • Awarded ISO9001 Certification
  • Introduction of the .039 inch centers, .160 inch stroke (039-16 Series) test probes, ­sockets and wire jacks
1999
  • Broke ground on new 70,000 square foot headquarters
2000
  • Introduction of the .125 inch centers, .250 inch stroke (125-25 Series) test probes and sockets
2001
  • Introduction of our X75 and X50, X Probe Socketless Series
  • Move into new facility located at 110 Towle Farm Road, Hampton, New Hampshire
2002
  • Introduction of our X39-25 X Socketless Series probes and termination pins
2003
  • Introduction of our Micro IC Probe Series for BGA and integrated circuit testing
  • U.S. Patent #6,570,399 is granted for X Probe Socketless Technology
2004
  • Introduction of lead-free (Pb-free) sockets
  • U.S. Patent #6,767,260 is granted for integraMate hyperboloid contact technology
2005
  • U.S. Patent #6,876,530 is granted for X Probe Socketless Technology jack termination
2006
  • Introduction of High Preload “E” Spring in our .100", .075" and.050" probes
2007
  • Introduction of integraMate .6mm hyperboloid contacts (ICO6 Series) and circular connectors (DO2 Series)
2008
  • Introduction of integraMate 1.5mm hyperboloid contacts (ICOA5 Series)
  • Introduction of integraMate .45mm, .5mm and .6mm hyperboloid contacts (ICS Series)
  • Introduction of new Steel Razor Tip Styles, solving today's test challenges.
2009
  • Introduction of .050 inch center, .400 stroke (050-T40 & X39-40 Series)
2011
  • Introduction of X31-25 X Probe Socketless Series & terminations
  • Introduction of new wire grip terminations for 50mil sockets and termination pins.
2012
  • Introduction of conventional 39mil double-ended sockets for wireless testing.
  • Introduction of 050-R40 Series long strong probes.
2013
  • Introduction of conventional 156-25 Series,156mil probes and sockets
  • Introduction of X31 double ended wireless termination pins
  • Introduction of 039-40 and X31-40 long stroke probes
2014
  • Introduction of conventional 187-25 Series, 187mil probes and sockets
2016
  • Introduction of .35mm double ended probe
2017
  • Introduction of silver plated high current probes, for 125-25, 156-25 & 187-25 Series