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NEW "8R" Razor and "H" High Spring Force for 39mil and X31, .400" Long Stroke Probes PDF


NEW Elevated "Y" Spring Force for 39mil and X31, .250" Stroke Probes PDF


NEW 58 Steel Crown Tip Style for contacting through hole components, posts & connectors PDF


NEW High Current Socket for 125mil centers; 125-25 series PDF


2015 PROBE GUIDE is now available. This publication is designed to be a short form catalog giving a brief product description without the technical details. Request your copy or download a PDF More...

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  Probe Design and Construction

QA Technology’s test probe products are designed and primarily utilized for testing of printed circuit boards and for interfacing test fixtures to automatic test equipment (ATE).

Our test products use a two-part system: a probe and a socket or termination pin. This system gives the best electrical contact when testing the various UUT configurations, such as target types and board manufacturing processes. We offer a wide range of products to test various applications including functional and in-circuit test, as well as solutions to the ever changing industry process challenges.

Features & Benefits of Conventional QA Test Probes & Sockets

As the world of electronics continues to shrink, higher circuit density packages are required to fit more in the same space, or better yet, less space. QA’s patented X Probe Socketless design concept is taking a larger more robust probe and mounting it on closer centers compared to a conventional probe and socket system. QA’s conventional and X Probe series are offered in both traditional wired and double-ended, wireless configurations.

Features & Benefits of X Probe Socketless Test Probes & Terminations

 

      110 Towle Farm Rd., Hampton, NH 03842 | 603.926.1193 | Fax 603.926.8701 | sales@qatech.com
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