QA Technology is globally recognized for exceptional product performance, competitive prices, fast delivery and outstanding service.
Our spring loaded test probes and hyperboloid contacts are trusted and specified by the world’s most recognized technology companies and PCB test fixture manufacturers. Our customers know they will produce a higher quality product, meet delivery demands, and achieve higher production yields.
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IN-CIRCUIT/FUNCTIONAL (ICT/FCT) TEST PROBES
For in-circuit or functional testing of loaded or bare printed circuit boards.
For higher circuit density; larger probes mounted on closer centers
High conductivity, proprietary metals to carry increased electrical currents.
For use as electromechanical contact between fixture and tester.
DOUBLE ENDED PROBES
For use in testing semiconductor components, such as integrated circuits (IC) and ball grid arrays (BGA).
QA Technology’s high-performance hyperboloid contacts provide a robust and flexible connector system with the flexibility to accommodate standard and custom applications.
Low Cost Silver Plated Tube for Small Centers Probes
Our new silver plated (V) probe tube provides low resistance and reliable performance without sacrificing longevity.
Expanding Plating/Color Options in Small Size Sockets
QA is now offering different plating options in our smaller sized 0.039" and 0.050" center sockets. These options allow for a visual identifier for faster probe replacement when required by the end user.
Three Tip Styles For 100-50 Series Probes
QA’s three new tip styles (13, 19 and 89) are now available in our 100mil, 0.500” [12.70mm] stroke, 100-50 series probes.
Bottom Side Extraction Tool for Damaged Sockets
In applications where pushing a damaged socket through the plate is not feasible, these tools enable socket removal by driving the socket out from the bottom side of the plate (termination end), minimizing damage to the plate and surrounding components.
