QA Technology is globally recognized for exceptional product performance, competitive prices, fast delivery and outstanding service.
Our spring loaded test probes and hyperboloid contacts are trusted and specified by the world’s most recognized technology companies and PCB test fixture manufacturers. Our customers know they will produce a higher quality product, meet delivery demands, and achieve higher production yields.
IN-CIRCUIT/FUNCTIONAL (ICT/FCT) TEST PROBES
For in-circuit or functional testing of loaded or bare printed circuit boards.
For higher circuit density; larger probes mounted on closer centers
High conductivity, proprietary metals to carry increased electrical currents.
For use as electromechanical contact between fixture and tester.
DOUBLE ENDED PROBES
For use in testing semiconductor components, such as integrated circuits (IC) and ball grid arrays (BGA).
QA Technology’s high-performance hyperboloid contacts provide a robust and flexible connector system with the flexibility to accommodate standard and custom applications.